Atomic Force Microscopy (AFM)
BRALM
Bilbao / Leioa
Atomic Force Microscopy (AFM) at Basque Resource for Advanced Light Microscopy
About the Installation
Uses a physical probe to scan a surface, measuring topographical and mechanical forces (stiffness, adhesion) at sub-nanometric resolution.
How this lab uses this technology
Possibility of High Speed/Fast AFM